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Comments on Milani, M et al. (2005) Scanning "Read-out of soft X-ray contact microscopy microradiographs by focused ion beam/scanning electron microscope." (0)
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Milani, M, Drobne, D, Tatti, F, Batani, D, Poletti, G, Orsini, F, Zullini, A, & Zrimec, A (2005). Read-out of soft X-ray contact microscopy microradiographs by focused ion beam/scanning electron microscope. Scanning, 27, 249-53. doi:10.1002/sca.4950270505
A novel focused ion beam-based technique is presented for the read-out of microradiographs of Caenorhabditis elegans nematodes generated by soft x-ray contact microscopy (SXCM). In previous studies, the read-out was performed by atomic force microscopy (AFM), but in our work SXCM microradiographs were imaged by scanning ion microscopy (SIM) in a focused ion beam/scanning electron microscope (FIB/SEM). It allows an ad libitum selection of a sample region for gross morphologic to nanometric investigations, with a sequence of imaging and cutting. The FIB/SEM is less sensitive to height variation of the relief, and sectioning makes it possible to analyse the sample further. The SXCM can be coupled to SIM in a more efficient and faster way than to AFM. Scanning ion microscopy is the method of choice for the read-out of microradiographs of small multicellular organisms.
Authors: Milani, M, Drobne, D, Tatti, F, Batani, D, Poletti, G, Orsini, F, Zullini, A, Zrimec, A