Developmental patterning in Caenorhabditis elegans proceeds in a stereotyped manner and is considered highly invariant. We use the terminal number of seam cells as an experimental model to understand mechanisms of developmental robustness to stochastic noise. To this end, we have conducted mutagenesis screens to identify mutants showing increased variance in seam cell number without necessarily displaying changes in the mean. One of the mutations we have recovered represents a null mutation in the fusogen gene
eff-1, which has been previously implicated in most cell fusion events in C. elegans including the fusion of the anterior cell daughter of the asymmetric seam cell divisions with the surrounding
hyp7 syncytium. To understand the developmental basis of cell number variability in
eff-1 mutants, we performed long-term time-lapse imaging of post-embryonic seam cell divisions. We found that despite the fusion defects in
eff-1 animals, seam cell division and differentiation patterns were mostly unaffected. This is largely because anterior cell daughters, despite their inability to fuse, differentiate normally by adopting a hypodermal fate, as evidence by the acquisition of hypodermal (
dpy-7,
elt-3) rather than seam cell fate marker expression (
egl-18,
nhr-73). We show that acquisition of hypodermal fate in anterior daughters correlated with breaks in adherens junctions, allowing their cytoplasmic continuity with the
hyp7 syncytium. Surprisingly, we found that the rare decrease in seam cell number was explained by a loss of seam cell identity in early larval stages due to inappropriate differentiation of both daughter cells to hypodermis. However, these errors were mostly compensated at later developmental stages, due to loss of anterior daughter cell differentiation to hypodermis, which contributes towards an increase in seam cell number. Taken together, these results refine the role of
eff-1 in epidermal seam cell patterning.